Novelx Stacked Silicon Technology

What is mySEM?

A research-grade SEM for imaging nanoscale objects and materials.

mySEM Product

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Novelx mySEM®

Powered by the patented Novelx Stacked Silicon Technology, the mySEM puts research-grade nanoscale imaging capabilities directly in your lab.

  • Thermal field emission electron source provides high signal-to-noise ratio and consistent long-lasting performance
  • Variable low-voltage imaging and sub-10nm resolution
  • Compact instrument fits your available lab space
  • Simple installation doesn't require dedicated facilities
  • Field replaceable FESEM cartridge

In the News

Novelx is Now Part of Agilent Technologies
Novelx has joined Agilent Technologies, the world’s premier measurement company.
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Novelx Wins Prestigious R&D 100 Award for Innovative Scanning Electron Microscope
Novelx mySEM® miniaturizes and drives the cost out of field emission scanning electron microscopes to distribute nanoscale imaging capabilities more broadly.
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