 |
 |
 |
 |
 |
 |
 |
|
|
|
|
|
|
|
Powered by the patented Novelx Stacked Silicon technology, the mySEM is a research-grade scanning electron microscope for imaging and characterizing nanoscale objects and materials. In a compact design that installs easily in your existing lab, the mySEM delivers capabilities only available in high-end field emission SEMs, at a fraction of the cost. Optimized for low-voltage operation and without need to coat non-conductive samples, the mySEM is an ideal choice for non-destructive imaging of energy sensitive samples, biomaterials and thin films. The mySEM can speed your research and product development cycles by decreasing the time from experimentation to characterization.
